NANO MECHANICAL AND NANOELECTRO MECHANICAL PHENOMENA IN 2D ATOMIC CRYSTALS
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- Author: NICHOLAS D. KAY
- ISBN: 9783319701806
- Availability: In Stock
Buy NANO MECHANICAL AND NANOELECTRO MECHANICAL PHENOMENA IN 2D ATOMIC CRYSTALS | Technical Books
This thesis introduces a unique approach of applying
atomic force microscopy to study the nanoelectromechanical properties of 2D
materials, providing high-resolution computer-generated imagery (CGI) and
diagrams to aid readers’ understanding and visualization. The isolation of
graphene and, shortly after, a host of other 2D materials has attracted a great
deal of interest in the scientific community for both their range of extremely
desirable and their record-breaking properties. Amongst these properties are
some of the highest elastic moduli and tensile strengths ever observed in
nature. The work, which was undertaken at Lancaster University’s Physics department
in conjunction with the University of Manchester and the National Physical
Laboratory, offers a new approach to understanding the nanomechanical and
nanoelectromechanical properties of 2D materials by utilising the nanoscale and
nanosecond resolution of ultrasonic force and heterodyne force microscopy (UFM
and HFM) – both contact mode atomic force microscopy (AFM) techniques. Using
this approach and developing several other new techniques the authors succeeded
in probing samples’ subsurface and mechanical properties, which would otherwise
remain hidden. Lastly, by using a new technique, coined electrostatic
heterodyne force microscopy (E-HFM), the authors were able to observe nanoscale
electromechanical vibrations with a nanometre and nanosecond resolution, in
addition to probing the local electrostatic environment of devices fabricated
from 2D materials.